HTOL test systems

Low TCOT at high quality and throughput

Our IOL & Power-Cycling systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform. We focus on complete monitoring and precise temperature control for each device under test.

System’s specific features

Complete logging of all devices under test during the complete test phase
Exact temperature control of each test object on its semiconductor structure
RF load of the samples possible
High throughput for each system
Fully automated test procedure
Automated test continuation according to characterization
Freely programmable test system based on National Instruments’ COTS platform
No test interruptions due to defective DUTs
Integrated safety system

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Technical Data

Devices under test (DUT‘S) per system (fully monitored)	16
DUT supply voltage (VDD)	1 V – 5.5 V
V_DD output current per DUT	10 mA
V_DD remote sense	✓
V_DD and supply current monitoring	✓
V_DD adjustable and switchable by software	✓
DUT IO voltage (VIO)	1.2 V – 3.6 V
V_IO output current per DUT	10 mA
V_IO remote sense	✓
V_IO adjustable and switchable by software	✓
DUT stimulation	FPGA
DUT stimulation voltage level	V_IO
DUT stimulation – output	5
DUT stimulation – bidirectional	1
Single DUT junction temperature control	✓
Adjustable test temperature	50 °C – 175 °C
Power dissipation per DUT	500 mW
Ramp up time (25 °C to 175 °C)	< 20 min
Ramp down time (175 °C to 50 °C)	< 30 min
DUT temperature control surface	30 mm x 30 mm
External DUT temperature sensor	PT100
External DUT temperature sensor – connection	4-wire
External DUT temperature sensor – excitation current	0.9 mA
External DUT temperature sensor – Resistance	0 Ω – 400 Ω
Internal DUT temperature measurement	Diode
Internal DUT temperature measurement – connection	4-wire
Internal DUT temperature measurement – excitation current	1 µA – 5 µA
Internal DUT temperature measurement – voltage	0 V – 600 mV
RF testing system	✓
Frequency	600 MHz – 2200 MHz
DUT RF power	10 W