HTRB test systems
Low TCOT at high quality and throughput
Our HTRB & H3TRB systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform.
System’s specific features
- Fewer climate chambers due to high number of DUTs tested simultaneously
- No test interruptions due to defective DUTs
- High throughput for each system
- Several different tests possible within one test run
- Complete logging of all devices under test during the complete test phase
- Fully automated test process
- Automated test continuation according to characterization
- Freely programmable test system based on National Instruments’ COTS platform
- Integrated safety system
Technical Data
|
HTRB Type 1 |
HTRB Type 2 |
H3TRB |
|
| Devices under test (DUTs) per system (fully monitored) |
240 |
120 |
120 |
| Adjustable test temperature |
50 up to 250°C |
50 up to 250°C |
climate chamber |
| Reverse voltage |
50 up to 600V |
50 up to 2000V |
50 up to 2000V |
| Current measurement per DUT |
1mA / 10mA / 20mA |
1mA / 10mA / 20mA |
1mA / 10mA / 20mA |
| Current monitoring per DUT |
✓ |
✓ |
✓ |
| Single DUT control |
✓ |
✓ |
✓ |
| Number of controllable power sources |
1 up to 6 |
1 up to 6 |
1 up to 6 |
| Safety system |
✓ |
✓ |
✓ |
| SQL Database adapter |
✓ |
✓ |
✓ |
